BS CECC 90000 Addendum No. 1-1983 电子元器件用质量评估协调体系.一般规范:单块集成电路.内部目测检验

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【英文标准名称】:Harmonizedsystemofqualityassessmentforelectroniccomponents-Genericspecification:monolithicintegratedcircuits-Internalvisualinspection
【原文标准名称】:电子元器件用质量评估协调体系.一般规范:单块集成电路.内部目测检验
【标准号】:BSCECC90000AddendumNo.1-1983
【标准状态】:现行
【国别】:英国
【发布日期】:1983-07-29
【实施或试行日期】:1983-07-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:电路;集成电路;外观检查(试验);喷镀金属;检验;显微分析;认可试验;质量保证体系;电子设备及元件;试验条件;缺陷;资格鉴定;粒度分布;表面缺陷;单片集成电路;规范(验收);质量控制;钝化
【英文主题词】:Approvaltesting;Assessedquality;Circuits;Defects;Electronicequipmentandcomponents;Inspection;Integratedcircuits;Metallizing;Microscopicanalysis;Monolithicintegratedcircuits;Particlesizedistribution;Passivation;Qualificationapproval;Qualityassurancesystems;Qualitycontrol;Specification(approval);Surfacedefects;Testingconditions;Visualinspection(testing)
【摘要】:BritishStandardHarmonizedsystemofqualityassessmentforelectroniccomponentsGenericspecification:MonolithicintegratedcircuitsAddendum1.ScreeningPREFACEA1PURPOSEA2APPARATUSA3PROCEDURESA3.1IntroductionA3.1.1GeneralA3.1.2SequenceofInspectionA3.1.3AircleanlinessclassesA3.1.4InspectioncontrolA3.1.5MagnificationA3.1.6DefinitionsA3.1.7InterpretationsA3.2TestCondition"A"A3.2.1Metallizationdefects(highmagnification)A3.2.2Diffusionandpassivationlayer(s)faults(highmagnification)A3.2.3Scribinganddiedefects(highmagnification)A3.2.4BondInspection(lowmagnification)A3.2.5Internalleads(lowmagnification)A3.2.6Packageconditions(magnificationasIndicated)A3.2.7Glassivationdefects(highmagnification)A3.2.8DielectricIsolation(highmagnification)A3.2.9Filmresistor(highmagnification)A3.3TestConditions"B"A3.3.1Metallizationdefects(highmagnification)A3.3.2Diffusionandpassivationlayer(s)faults(highmagnification)A3.3.3Scribinganddiedefects(highmagnification)A3.3.4BondInspection(lowmagnification)A3.3.5Internalleads(lowmagnification)
【中国标准分类号】:L56;L00
【国际标准分类号】:31_200
【页数】:56P.;A4
【正文语种】:英语